Test for Reliability for Mission Critical Applications
نویسندگان
چکیده
Test for Reliability is a test flow where an Integrated Circuit (IC) device continuously stressed under several corner conditions that can be dynamically adapted based on the real-time observation of critical signals during evolution test. We present our approach successful Test-for-Reliability flow, going beyond objectives traditional reliability approach, and covering entire process from design to failure analysis.
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ژورنال
عنوان ژورنال: Electronics
سال: 2021
ISSN: ['2079-9292']
DOI: https://doi.org/10.3390/electronics10161985